2024
Articles dans une revue
Alexandre Boyer, Fabrice Caignet. A Pre-Scan Method to Accelerate Near-Field Scan Immunity Tests. IEEE Letters on Electromagnetic Compatibility Practice and Applications, In press, pp.1-1. ⟨10.1109/LEMCPA.2024.3363113⟩. ⟨hal-04445606⟩
2023
Communications dans un congrès
Alexandre Boyer, Fabrice Caignet. METHODE DE PRE-SCAN POUR ACCELERER LES TEMPS DE MESURE DU SCAN CHAMP PROCHE EN IMMUNITE. 21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France. ⟨hal-04203229⟩
François Ruffat, Fabrice Caignet, Alexandre Boyer, Guillaume Mejecaze, Fabien Escudie, et al.. MÉTHODE D'EXTRACTION RAPIDE ET EFFICACE D'UN MODÈLE DE PROTECTION ESD FACE À DES PHÉNOMÈNES TRANSITOIRES RAPIDES. 21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France. ⟨hal-04203263⟩
2022
Articles dans une revue
François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. New Measurement Method to Investigated Service Life of Protection Networks exposed to ESD. Microelectronics Reliability, 2022, 33rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ⟨10.1016/j.microrel.2022.114661⟩. ⟨hal-03788175⟩
Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Alexandre Boyer. Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model from TLP Measurements. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (1), pp.47 - 57. ⟨10.1109/TEMC.2021.3106770⟩. ⟨hal-03408285⟩
Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (5), pp.1493 - 1505. ⟨10.1109/TEMC.2022.3172601⟩. ⟨hal-03681022⟩
Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level - Part I. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (4), pp.1230 - 1242. ⟨10.1109/TEMC.2022.3169183⟩. ⟨hal-03664433⟩
Communications dans un congrès
François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. New Measurement Method to Investigated Service Life of Protection Networks exposed to ESD. 33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF2022), Sep 2022, Berlin, Germany. ⟨10.1016/j.microrel.2022.114661⟩. ⟨hal-03788168⟩
Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level. International Symposium on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900970⟩. ⟨hal-03773209⟩
François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. A fast and efficient Model Extraction Method to predict the transient Response of ESD Protection Devices. International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9901148⟩. ⟨hal-03773211⟩
2021
Articles dans une revue
Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Transactions on Instrumentation and Measurement, 2021, 70, ⟨10.1109/TIM.2021.3126376⟩. ⟨hal-03423272⟩
Communications dans un congrès
Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Anticipating Common-Mode Conducted Emission of DC-DC Converter from Electric Near-Field Scan. 2021 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY, AND EMC EUROPE, Jul 2021, Glasgow (virtuel), United Kingdom. ⟨10.1109/EMC/SI/PI/EMCEurope52599.2021.9559364⟩. ⟨hal-03321009⟩
2020
Articles dans une revue
Lionel Séguier, Vincent Boitier, Florian Huet, Jean-Marie Dilhac, Fabrice Caignet. Réalisation d'une alimentation DC 3,3V sans pile avec récupération d'énergie photovoltaïque et stockage sur supercapacités pour l'alimentation d'un capteur sans fil basse consommation. La Revue 3E.I, 2020, 101, pp.13-24. ⟨hal-02651454⟩
2019
Autres documents
Nicolas Nolhier, Nathalie Labat, Hélène Frémont, François Marc, Fabrice Caignet, et al.. Proceedings of the 30th European Symposium on the reliability of electron devices, failure physics and analysis. ESREF 2019, Sep 2019, Microelectronics Reliability, 100-101, pp.113498, 2019, ⟨10.1016/j.microrel.2019.113498⟩. ⟨hal-02884107⟩
2018
Livres
Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. Méthodologies de protection ESD : du composant au système. ISTE Editions. 280p., 2018, 9781784053260. ⟨hal-01702094⟩
Chapitres d’ouvrages
Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. Voiture autonome : le défi du zéro défaut pour la fiabilité des systèmes électroniques embarqués. Transports du futur: Regards croisés de chercheur.e.s, 37, pp.20, 2018, Collection Petit illustré. ⟨hal-01980187⟩
2017
Articles dans une revue
Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectronics Reliability, 2017, 76-77, pp.685 - 691. ⟨10.1016/j.microrel.2017.07.032⟩. ⟨hal-01698397⟩
Livres
Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. ESD Protection Methodologies: From Component to System. Elsevier, 284p., 2017, 978-1-78548-122-2. ⟨hal-01613901⟩
Communications dans un congrès
Genevieve Duchamp, Fabrice Caignet. The impacts of EMC/ESD on embedded systems: a challenge for safe systems achievement.. ESREF 2017, Sep 2017, Bordeaux, France. ⟨hal-01719890⟩
Fabien Escudié, Fabrice Caignet, Nicolas Nolhier. LIN communication behaviours against ESD events. 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/EMCEurope.2017.8094675⟩. ⟨hal-01698505⟩
Fabrice Caignet, G. Duchamp. The impacts of EMC/ESD on embedded systems: a challenge for safe systems achievement.. Proceedings of ESREF 2017, 2017, Bordeaux, France. ⟨hal-02516022⟩
2016
Articles dans une revue
Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Impact of non-linear capacitances on transient waveforms during system level ESD stress. Microelectronics Reliability, 2016, Proceedings of the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 64, pp.88 - 92. ⟨10.1016/j.microrel.2016.07.046⟩. ⟨hal-01497515⟩
Communications dans un congrès
Fabien Escudié, Fabrice Caignet, Nicolas Nolhier. Modélisation de système pour la prédiction de défaillances dues aux décharges électrostatiques. Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2016), May 2016, Toulouse, France. 5p. ⟨hal-01698411⟩
Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. From quasi-static to transient system level ESD simulation: Extraction of turn-on elements. Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2016 38th, ESD Association, Sep 2016, Anaheim, United States. pp.1 - 10, ⟨10.1109/EOSESD.2016.7592563⟩. ⟨hal-01387072⟩
Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Présentation d'un travail normatif de modélisation de système pour la prédiction de défaillance ESD. 18 ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2016) , Jul 2016, Rennes, France. 6p. ⟨hal-01698420⟩
2015
Articles dans une revue
Claude Vanhecke, Laurent Assouère, Anqing Wang, Paul Durand-Estèbe, Fabrice Caignet, et al.. Multisource and Battery-free Energy Harvesting Architecture for Aeronautics Applications. IEEE Transactions on Power Electronics, 2015, 30 (6), pp.3215-3227. ⟨10.1109/TPEL.2014.2331365⟩. ⟨hal-01020992v2⟩
Chapitres d’ouvrages
Marise Bafleur, Fabrice Caignet, Nicolas Nolhier, Patrice Besse, Jean-‐philippe Lainé. Protecting Mixed-Signal Technologies Against Electrostatic Discharges: Challenges and Protection Strategies from Component to System. Thomas NOULIS. Mixed-signal circuits, CRC PRESS, 40p. Chapter 3, 2015, Devices, Circuits, and Systems Series, 9781482260625. ⟨hal-01218627⟩
Communications dans un congrès
Rémi Bèges, Fabrice Caignet, Patrice Besse, Jean-Philippe Laine, Alain Salles, et al.. TLP-based Human Metal Model stress generator and analysis method of ESD generators. Electrical Overstress / Electrostatic Discharge Symposium (EOS/ESD 2015), Sep 2015, Reno, United States. ⟨10.1109/EOSESD.2015.7314777⟩. ⟨hal-01239451⟩
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Dynamic system level ESD current measurement using magnetic field probe. Asia-Pacific International Symposium on Electromagnetic Compatibility ( APEMC ), May 2015, Taipei, Taiwan. ⟨10.1109/APEMC.2015.7175400⟩. ⟨hal-01239444⟩
Fabrice Caignet, Rémi Bèges, Patrice Besse, Jean-Philippe Lainé, Nicolas Nolhier, et al.. Hierarchical Modeling Approach for System Level ESD Analysis: From Hard to Functional Failure. Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) , May 2015, TAIPEI, Taiwan. 4p., ⟨10.1109/APEMC.2015.7175399⟩. ⟨hal-01843414⟩
Thèse de doctorat, Habilitation à diriger des recherches
Fabrice Caignet. Approche systémique pour l’analyse de l’impact des décharges électrostatiques : du composant au système. Micro et nanotechnologies/Microélectronique. Universite Toulouse III Paul Sabatier, 2015. ⟨tel-01292134⟩
2014
Articles dans une revue
Bertrand Courivaud, Nicolas Nolhier, G Ferru, Marise Bafleur, Fabrice Caignet. Reliability of ESD protection devices designed in a 3D technology. Microelectronics Reliability, 2014, Microelectronics Reliability, 54 (9), pp.2272-2277. ⟨10.1016/j.microrel.2014.07.136⟩. ⟨hal-01218702⟩
Communications dans un congrès
Bertrand Courivaud, Nicolas Nolhier, G. Ferru, Marise Bafleur, Fabrice Caignet. Novel 3D back-to-back diodes ESD protection. Electrical Overstress/Electrostatic Discharge (EOS/ESD) Symposium , Sep 2014, Tucson, AZ, United States. 4p. ⟨hal-01843388⟩
Marise Bafleur, Rémi Bèges, Fabrice Caignet, André Durier, Christian Marot, et al.. Practical Transient System-level ESD Modeling - Environment Contribution. Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Sep 2014, Tucson, AZ, United States. 10p. ⟨hal-01843080⟩
Bertrand Courivaud, Nicolas Nolhier, G. Ferru, Marise Bafleur, Fabrice Caignet. Novel 3D back-to-back diodes ESD protection. International ESD Workshop (IEW) , May 2014, Villard de Lans, France. 2p. ⟨hal-01843394⟩
