2025

Articles dans une revue

François Ruffat, Alexandre Boyer, Fabrice Caignet, Guillaume Mejecaze, Frédéric Puybaret, et al.. Increasing Precision of Impedance Measurements for ESD Protection's Frequency Models. IEEE Transactions on Electromagnetic Compatibility, 2025, 67 (4), pp.1064 - 1073. ⟨10.1109/TEMC.2025.3542314⟩. ⟨hal-05032615⟩

Communications dans un congrès

L Kemystetter, Alexandre Boyer, G Mejecaze, F Puybaret, François Ruffat, et al.. Frequency Model Investigation for ESD failure prediction. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-04998664⟩

Pré-publications, documents de travail

Fabrice Caignet, François Ruffat, Kemystetter Lucas, Alexandre Boyer, Guillaume Mejecaze, et al.. Reflection to improve ESD protection simulation based on voltage-dependent dynamic model. 2025. ⟨hal-04978913⟩

2024

Articles dans une revue

Alexandre Boyer, Fabrice Caignet. A Pre-Scan Method to Accelerate Near-Field Scan Immunity Tests. IEEE Letters on Electromagnetic Compatibility Practice and Applications, In press, pp.1-1. ⟨10.1109/LEMCPA.2024.3363113⟩. ⟨hal-04445606⟩

Alexandre Boyer, Fabrice Caignet, Matthieu Laidet. An Efficient Characterization Method to Predict the Susceptibility of Integrated Circuits to Multitone Disturbance. IEEE Transactions on Electromagnetic Compatibility, 2024, 66 (6), pp.1793 - 1803. ⟨10.1109/TEMC.2024.3448495⟩. ⟨hal-04689761⟩

Communications dans un congrès

Alexandre Boyer, Fabrice Caignet. Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance. 1'th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, Oct 2024, Turin (IT), Italy. ⟨10.1109/EMCCompo61192.2024.10742041⟩. ⟨hal-04734444⟩

Alexandre Boyer, Fabrice Caignet. Study of the Multifrequency Susceptibility of Operational Amplifiers. EMC Europe 2024 Symposium, Sep 2024, Brugges, Belgium. ⟨10.1109/EMCEurope59828.2024.10722498⟩. ⟨hal-04689775⟩

Kemystetter Lucas, Mejecaze Guillaume, Fabrice Caignet, Alexandre Boyer, François Ruffat, et al.. Modèles fréquentiels forts niveaux pour la prédiction d’impact d’impulsion électromagnétique sur les systèmes. Workshop CEM 2024, Dec 2024, Angers, France. ⟨hal-04831591⟩

2023

Communications dans un congrès

Alexandre Boyer, Fabrice Caignet. METHODE DE PRE-SCAN POUR ACCELERER LES TEMPS DE MESURE DU SCAN CHAMP PROCHE EN IMMUNITE. 21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France. ⟨hal-04203229⟩

François Ruffat, Fabrice Caignet, Alexandre Boyer, Guillaume Mejecaze, Fabien Escudie, et al.. MÉTHODE D'EXTRACTION RAPIDE ET EFFICACE D'UN MODÈLE DE PROTECTION ESD FACE À DES PHÉNOMÈNES TRANSITOIRES RAPIDES. 21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France. ⟨hal-04203263⟩

2022

Articles dans une revue

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (5), pp.1493 - 1505. ⟨10.1109/TEMC.2022.3172601⟩. ⟨hal-03681022⟩

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Alexandre Boyer. Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model from TLP Measurements. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (1), pp.47 - 57. ⟨10.1109/TEMC.2021.3106770⟩. ⟨hal-03408285⟩

François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. New Measurement Method to Investigated Service Life of Protection Networks exposed to ESD. Microelectronics Reliability, 2022, 33rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ⟨10.1016/j.microrel.2022.114661⟩. ⟨hal-03788175⟩

Fabrice Caignet, François Ruffat, Alexandre Boyer, Guillaume Mejecaze, Fabien Escudie, et al.. Investigation of Frequency Models to Predict Dynamic Behavior of ESD Protection Networks. IEEE Transactions on Electromagnetic Compatibility, 2022, 64, pp.1890 - 1898. ⟨10.1109/temc.2022.3221312⟩. ⟨hal-04863950⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level - Part I. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (4), pp.1230 - 1242. ⟨10.1109/TEMC.2022.3169183⟩. ⟨hal-03664433⟩

Fabrice Caignet, François Ruffat, Alexandre Boyer, Guillaume Mejecaze, Fabien Escudié, et al.. Investigation of Frequency Models to predict Dynamic Behavior of ESD Protection Networks. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (6), pp.1890-1898. ⟨10.1109/TEMC.2022.3221312⟩. ⟨hal-04870383⟩

Communications dans un congrès

François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. New Measurement Method to Investigated Service Life of Protection Networks exposed to ESD. 33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF2022), Sep 2022, Berlin, Germany. ⟨10.1016/j.microrel.2022.114661⟩. ⟨hal-03788168⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level. International Symposium on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900970⟩. ⟨hal-03773209⟩

François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. A fast and efficient Model Extraction Method to predict the transient Response of ESD Protection Devices. International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9901148⟩. ⟨hal-03773211⟩

2021

Articles dans une revue

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Transactions on Instrumentation and Measurement, 2021, 70, ⟨10.1109/TIM.2021.3126376⟩. ⟨hal-03423272⟩

Communications dans un congrès

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Anticipating Common-Mode Conducted Emission of DC-DC Converter from Electric Near-Field Scan. 2021 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY, AND EMC EUROPE, Jul 2021, Glasgow (virtuel), United Kingdom. ⟨10.1109/EMC/SI/PI/EMCEurope52599.2021.9559364⟩. ⟨hal-03321009⟩

2020

Articles dans une revue

Lionel Séguier, Vincent Boitier, Florian Huet, Jean-Marie Dilhac, Fabrice Caignet. Réalisation d'une alimentation DC 3,3V sans pile avec récupération d'énergie photovoltaïque et stockage sur supercapacités pour l'alimentation d'un capteur sans fil basse consommation. La Revue 3E.I, 2020, 101, pp.13-24. ⟨hal-02651454⟩

2019

Autres documents

Nicolas Nolhier, Nathalie Labat, Hélène Frémont, François Marc, Fabrice Caignet, et al.. Proceedings of the 30th European Symposium on the reliability of electron devices, failure physics and analysis. ESREF 2019, Sep 2019, Microelectronics Reliability, 100-101, pp.113498, 2019, ⟨10.1016/j.microrel.2019.113498⟩. ⟨hal-02884107⟩

2018

Livres

Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. Méthodologies de protection ESD : du composant au système. ISTE Editions. 280p., 2018, 9781784053260. ⟨hal-01702094⟩

Chapitres d’ouvrages

Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. Voiture autonome : le défi du zéro défaut pour la fiabilité des systèmes électroniques embarqués. Transports du futur: Regards croisés de chercheur.e.s, 37, pp.20, 2018, Collection Petit illustré. ⟨hal-01980187⟩

2017

Articles dans une revue

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectronics Reliability, 2017, 76-77, pp.685 - 691. ⟨10.1016/j.microrel.2017.07.032⟩. ⟨hal-01698397⟩

Livres

Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. ESD Protection Methodologies: From Component to System. Elsevier, 284p., 2017, 978-1-78548-122-2. ⟨hal-01613901⟩

Communications dans un congrès

Genevieve Duchamp, Fabrice Caignet. The impacts of EMC/ESD on embedded systems: a challenge for safe systems achievement.. ESREF 2017, Sep 2017, Bordeaux, France. ⟨hal-01719890⟩

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier. LIN communication behaviours against ESD events. 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/EMCEurope.2017.8094675⟩. ⟨hal-01698505⟩

Fabrice Caignet, G. Duchamp. The impacts of EMC/ESD on embedded systems: a challenge for safe systems achievement.. Proceedings of ESREF 2017, 2017, Bordeaux, France. ⟨hal-02516022⟩

2016

Articles dans une revue

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Impact of non-linear capacitances on transient waveforms during system level ESD stress. Microelectronics Reliability, 2016, Proceedings of the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 64, pp.88 - 92. ⟨10.1016/j.microrel.2016.07.046⟩. ⟨hal-01497515⟩

Communications dans un congrès

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. From quasi-static to transient system level ESD simulation: Extraction of turn-on elements. Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2016 38th, ESD Association, Sep 2016, Anaheim, United States. pp.1 - 10, ⟨10.1109/EOSESD.2016.7592563⟩. ⟨hal-01387072⟩

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier. Modélisation de système pour la prédiction de défaillances dues aux décharges électrostatiques. Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2016), May 2016, Toulouse, France. 5p. ⟨hal-01698411⟩

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Présentation d'un travail normatif de modélisation de système pour la prédiction de défaillance ESD. 18 ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2016) , Jul 2016, Rennes, France. 6p. ⟨hal-01698420⟩