2025

Communications dans un congrès

Edinso Marina, René Rongen, Pierre Turpin, Patrick Tounsi, Sonia Ben Dhia. Long-Term Drift of a Bandgap Voltage Reference by Molding Compound Oxidation during Extended Thermal Aging. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323104⟩

Matthieu Laidet, Alexandre Boyer, Julien Gazave, Sonia Ben Dhia. Fast detection of EMC level drifts induced by aging using biased thermal step stress : Application to an AC input EMC filter. 2025 Asia-Pacific International Symposium and Exhibition on Electromagnetic Compatibility (APEMC), May 2025, Taipei, Taiwan. pp.168-171, ⟨10.1109/APEMC62958.2025.11051419⟩. ⟨hal-05144813⟩

2024

Communications dans un congrès

Matthieu Laidet, Alexandre Boyer, Julien Gazave, Sonia Ben Dhia. Accelerated characterisation of Operational Amplifiers' susceptibility using multitone disturbance. 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, Oct 2024, Turin, Italy. ⟨10.1109/EMCCompo61192.2024.10742035⟩. ⟨hal-04734457⟩

2023

Communications dans un congrès

Etienne Sicard, Sonia Ben Dhia, Lionel Trojman. Conception de cellules nano-CMOS -Perspectives à dix ans. 7èmes Journées Pédagogiques - JPCNFM 2023, INSA Toulouse, Nov 2023, Toulouse, France. ⟨hal-04502940⟩

Alexandre Boyer, Sonia Ben Dhia, Sébastien Serpaud. In-Situ and Contactless Evaluation of Performance of Power Converter EMC Filter based on Near-Field Scan Measurement. EMC Europe 2023, Sep 2023, Cracovie (PL), Poland. ⟨hal-04227850⟩

Alexandre Boyer, Sébastien Serpaud, Sonia Ben Dhia, Fabio Coccetti. Performance Charaterisation of the Decoupling Capacitor Network using the Near-Field Measurement. EMC Europe 2023, Sep 2023, Cracovie, Poland. ⟨hal-04227864⟩

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Mathieu Aribeau. Passive Cell Balancing Impact On Injection Levels During Direct Power injection on Battery Management System. EMC Europe 2023, Sep 2023, Cracovie, Poland. ⟨hal-04227871⟩

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Hiba Mediouni, et al.. UNE ETUDE COMPARATIVE DES NIVEAUX DPI SUR UN CI BMS AVEC UN MODELE ANALYTIQUE DES RESONANCES. 21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France. ⟨hal-04203247⟩

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Olivier Tico, et al.. Analytical Approach of The High Susceptibility Frequencies of a Battery Management System During Direct Power Injection. Methods of Improvement. IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY (EMC+SIPI 2023), Jul 2023, Grand Rapids, United States. ⟨10.1109/EMCSIPI50001.2023.10241599⟩. ⟨hal-04203286⟩

2022

Articles dans une revue

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level - Part I. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (4), pp.1230 - 1242. ⟨10.1109/TEMC.2022.3169183⟩. ⟨hal-03664433⟩

Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia, Fabio Coccetti. Efficiency of Sequential Spatial Adaptive Sampling Algorithm to Accelerate Multi-Frequency Near-Field Scanning Measurement. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (3), pp.816 - 826. ⟨10.1109/TEMC.2021.3136096⟩. ⟨hal-03543405⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (5), pp.1493 - 1505. ⟨10.1109/TEMC.2022.3172601⟩. ⟨hal-03681022⟩

Communications dans un congrès

André Durier, Sonia Ben Dhia, Alexandre Boyer, Tristan Dubois. A new Investigation Methodology to predict Far Field Radiated Immunity from Near Field Scan Immunity Measurements. International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900974⟩. ⟨hal-03773310⟩

Saliha Chetouani, Alexandre Boyer, Sonia Ben Dhia, Sébastien Serpaud, André Durier. A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change. 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2021), Mar 2022, Brugges, Belgium. ⟨10.1109/EMCCompo52133.2022.9758624⟩. ⟨hal-03654075⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level. International Symposium on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900970⟩. ⟨hal-03773209⟩

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Hiba Mediouni, et al.. A Comparative Study of DPI levels on BMS IC With an On-Hand Analytical Model to Predict Resonances. International Symposium and Exhibition on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9901210⟩. ⟨hal-03773305⟩

Badr Guendouz, Philippe Perruchoud, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia. A Simple Analytical Approximation to evaluate Noise Levels and Maximum Coupling Frequencies During DPI Simulations on BMS IC. Asia Pacific International Conference on EMC (APEMC) 2022, Sep 2022, Beijing, China. ⟨10.1109/APEMC53576.2022.9888479⟩. ⟨hal-03773319⟩

2021

Articles dans une revue

Alexandre Boyer, Sonia Ben Dhia. Low-Cost Broadband Electronic Coupler for Estimation of Radiated Emission of Integrated Circuits in TEM Cell. IEEE Transactions on Electromagnetic Compatibility, 2021, 63 (2), pp.636-639. ⟨10.1109/TEMC.2020.3021135⟩. ⟨hal-02937460⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Transactions on Instrumentation and Measurement, 2021, 70, ⟨10.1109/TIM.2021.3126376⟩. ⟨hal-03423272⟩

Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia, Fabio Coccetti. Fast and Accurate Near-Field Measurement Method using Sequential Spatial Adaptive Sampling (SSAS) Algorithm. IEEE Transactions on Electromagnetic Compatibility, 2021, 63 (3), pp.858-869. ⟨10.1109/TEMC.2020.3025547⟩. ⟨hal-02967998⟩

Estevan L Lara, Allan A Constante, Juliano Benfica, Fabian Vargas, Alexandre Boyer, et al.. Impact of place and route strategy on FPGA electromagnetic emission. Microelectronics Reliability, 2021, 126, pp.114333. ⟨10.1016/j.microrel.2021.114333⟩. ⟨hal-03466580⟩

Communications dans un congrès

Estevan Lara, Allan Constante, Juliano Benfica, Fabian Vargas, Alexandre Boyer, et al.. Preliminary Study on the Impact of Place and Route Strategy on FPGA Electromagnetic Emission. 2021 Argentine Conference on Electronics (CAE2021), Mar 2021, Bahia Blanca (Virtual), Argentina. ⟨10.1109/CAE51562.2021.9397567⟩. ⟨hal-03206144⟩

Saliha Chetouani, Alexandre Boyer, Sébastien Serpaud, Sonia Ben Dhia. APPLICATION DES METHODES DE MESURES INDIRECTES DE PARAMETRES " S " EN VUE DE LA GESTION DE L'OBSOLESCENCE DES COMPOSANTS EN IMMUNITE CONDUITE. 20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021, Apr 2021, Lyon (virtuel), France. ⟨hal-03201537⟩

Alexandre Boyer, André Durier, Sonia Ben Dhia. UNE NOUVELLE SONDE DE MESURE DE TENSION INDUITE POUR L'INVESTIGATION EN IMMUNITE RAYONNEE. 20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021, Apr 2021, Lyon (Virtuel), France. ⟨hal-03201536⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Anticipating Common-Mode Conducted Emission of DC-DC Converter from Electric Near-Field Scan. 2021 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY, AND EMC EUROPE, Jul 2021, Glasgow (virtuel), United Kingdom. ⟨10.1109/EMC/SI/PI/EMCEurope52599.2021.9559364⟩. ⟨hal-03321009⟩

2020

Communications dans un congrès

Alexandre Boyer, Sonia Ben Dhia, André Durier. A new Voltage Measurement Probe for investigating Radiated Immunity Test. EMC Europe 2020, Sep 2020, Rome (virtual), Italy. ⟨hal-02951842⟩

Saliha Chetouani, Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Fast and efficient approach to predict EMC immunity of complex equipment after a component change. EMC Europe 2020, Sep 2020, Rome (online), Italy. ⟨hal-02951845⟩

2019

Articles dans une revue

Chaimae Ghfiri, Alexandre Boyer, Alain Bensoussan, André Durier, Sonia Ben Dhia. A new methodology for EMC prediction of integrated circuits after aging. IEEE Transactions on Electromagnetic Compatibility, 2019, 61 (2), pp.572-581. ⟨10.1109/TEMC.2018.2819722⟩. ⟨hal-01951615⟩

Communications dans un congrès

André Durier, Sonia Ben Dhia, Tristan Dubois. Study of the coupling of wide band Near Field Scan probe dedicated to the investigation of the radiated immunity of Printed Circuit Boards. 2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI), Jun 2019, Chambéry, France. pp.1-4, ⟨10.1109/SaPIW.2019.8781661⟩. ⟨hal-02522183⟩

Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Sequential adaptive sampling algorithm to reduce the near field measurement time. International Symposium on Electromagnetic Compatibility (EMC Europe 2019), Sep 2019, Barcelona, Spain. ⟨hal-02319466⟩

André Durier, Sonia Ben Dhia, Tristan Dubois. Study of the radiated immunity of a drain-source current sensor using Near Field Scan Immunity method. 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Oct 2019, Hangzhou, China. pp.52-54, ⟨10.1109/EMCCompo.2019.8919720⟩. ⟨hal-02523743⟩

Guillaume Auriol, Sonia Ben Dhia, Elodie Chanthery, Pierre-Emmanuel Hladik, Didier Le Botlan, et al.. Activité pédagogique sur la création d'un jeu d'évasion. 6ème Colloque Pédagogie & Formation - groupe INSA, May 2019, Bourges, France. ⟨hal-02307883⟩

Amirouche Oumaziz, Florian Huet, Sonia Ben Dhia. Alimentation de capteurs communicants par systèmes de récupération et de stockage d’énergies ambiantes à bas coût. TELECOM’2019 & 11èmes JFMMA, Jun 2019, Saïdia, Maroc. ⟨hal-02138449⟩

Sebastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Optimized algorithm to reduce the near-field measurement time on FPGA device. 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2019), Oct 2019, Haining, China. ⟨hal-02319472⟩

2018

Articles dans une revue

Chaimae Ghfiri, Alexandre Boyer, André Durier, Sonia Ben Dhia. A new methodology to build the Internal Activity Block of ICEM-CE for complex Integrated Circuits. IEEE Transactions on Electromagnetic Compatibility, 2018, 60 (5), pp.1500-1509. ⟨10.1109/TEMC.2017.2767084⟩. ⟨hal-01659770⟩

Communications dans un congrès

Chaimae Ghfiri, André Durier, C. Marot, Alexandre Boyer, Sonia Ben Dhia. Modeling the internal activity of an FPGA for conducted emission prediction purpose. 2018 Joint IEEE EMC & APEMC Symposium, May 2018, Singapour, Singapore. 6p. ⟨hal-01839745⟩

2017

Communications dans un congrès

Chaimae Ghfiri, Alexandre Boyer, Andre Durier, Sonia Ben Dhia. Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose. Congrès de l'école doctorale GEET, Mar 2017, Toulouse, France. 6p. ⟨hal-01500303⟩

Chaimae Ghfiri, André Durier, Alexandre Boyer, Sonia Ben Dhia. A new methodology to extract the ICEM-CE internal activity block of a FPGA. EMC Europe, Sep 2017, Angers, France. pp. 1-6. ⟨hal-01661809⟩

Chaimae Ghfiri, André Durier, Christian Marot, Alexandre Boyer, Sonia Ben Dhia. Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose. 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourgh, Russia. 6p. ⟨hal-01574384⟩

2016

Communications dans un congrès

Sonia Ben Dhia, Alexandre Boyer. A Review of Research on the Effect of Aging on the EMC of Integrated Circuits. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC 2016), May 2016, Shenzhen, China. ⟨10.1109/APEMC.2016.7522971⟩. ⟨hal-01403874⟩

Chaimae Ghfiri, André Durier, Alexandre Boyer, Sonia Ben Dhia, Christian Marot. Construction of an Integrated Circuit Emission Model of a FPGA. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.402-405, ⟨10.1109/APEMC.2016.7522751⟩. ⟨hal-01663667v2⟩

Alexandre Boyer, He Huang, Sonia Ben Dhia. Predicting the risk of non-compliance to EMC requirements during the life-cycle. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.452 - 455, ⟨10.1109/APEMC.2016.7522766⟩. ⟨hal-01403875⟩

Chaimae Ghfiri, Alexandre Boyer, André Durier, Sonia Ben Dhia, C Marot. Construction d'un modèle ICEM pour prédire l'émission électromagnétique d'un FPGA. 18e Colloque International et Exposition sur la Compatibilité Electromagnétique (CEM2016), Jul 2016, Rennes, France. 5p. ⟨hal-01403883⟩

2015

Articles dans une revue

He Huang, Alexandre Boyer, Sonia Ben Dhia. Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. Microelectronics Reliability, 2015, 55 (9-10), pp.2050-2054. ⟨10.1016/j.microrel.2015.07.008⟩. ⟨hal-01225338⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter. Microelectronics Reliability, 2015, 55 (9-10), pp. 2061-2066. ⟨10.1016/j.microrel.2015.06.058⟩. ⟨hal-01225333⟩

Communications dans un congrès

Marc Veljko Thomas Tomasevic, Alexandre Boyer, Sonia Ben Dhia. Development of an On-Chip Sensor for Substrate Coupling Study in Smart Power Mixed ICs. Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p. ⟨hal-01159221⟩

Marc Veljko Thomas Tomasevic, Alexandre Boyer, Sonia Ben Dhia. Bandgap Failure Study Due To Parasitic Bipolar Substrate Coupling In Smart Power Mixed ICs. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 5p. ⟨hal-01225358⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter. EMC Europe 2015, Aug 2015, Dresden, Germany. 6p. ⟨hal-01225350⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Analysis and Modelling of Passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France. ⟨hal-01225352⟩

Alexandre Boyer, Sonia Ben Dhia. Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends. Minapad Forum 2015, Apr 2015, Grenoble, France. 6p. ⟨hal-01159227⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Electronic counterfeit detection based on the measurement of electromagnetic fingerprint Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France. ⟨hal-01225354⟩

Alexandre Boyer, He Huang, Sonia Ben Dhia. ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. ⟨hal-01225377⟩

Marc Veljko Thomas Tomasevic, Alexandre Boyer, Sonia Ben Dhia, Alexander Steinmar, Weiss B., et al.. Coupling study in smart power mixed ICs with a dedicated on-chip sensor. EMC Europe 2015, Aug 2015, Dresden, Germany. ⟨10.1109/ISEMC.2015.7256236⟩. ⟨hal-01225345⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia, Bertrand Vrignon. Prediction of Aging Impact on Electromagnetic Susceptibility of an Operational Amplifier. Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p. ⟨hal-01159222⟩