Edinso Gabriel Marina Alonso, a doctoral student in the ESE team, CIFRE NXP, supervised by Patrick Tounsi and Sonia Ben Dhia, received one of the awards for best paper at the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2025) conference in Bordeaux on October 9, 2025.

The paper, entitled “Long-Term Drift of a Bandgap Voltage Reference by Molding Compound Oxidation during Extended Thermal Aging,” proposes an experimental method based on the analysis of the interaction between silicon and its encapsulation (package) to explain the electrical drift of a Bandgap voltage reference circuit stressed at high temperatures during long exposure.

Congrats !