Modern electronic systems, increasingly integrated and complex, are sensitive to intentional electromagnetic interference, particularly from radio-frequency directed energy weapons. Susceptibility is typically assessed through far-field tests, which are cumbersome to implement, or conducted injection, which is more targeted but highly intrusive. In this context, near-field scan emerges as a relevant intermediate alternative.
This thesis develops a methodology based on near-field injection for susceptibility analysis. A dedicated test bench was designed to localise sensitive areas, and a probe calibration method based on the elementary dipole assumption was developed to estimate the voltage induced at the component level. An analytical and experimental correlation between near-field measurements and conducted injection tests was established, validating the consistency of both approaches.
This work enables a direct link between the disturbance source and the voltage induced on the component, while enhancing the understanding of near-field coupling. Extrapolating these results to the far-field domain could allow for estimating the susceptibility threshold of a complete system under real-world electromagnetic threats.