2025

Conference papers

Romain Boyer, Christophe Viallon, Olivier Blanco, Arnaud Fernandez, Frédéric Camps, et al.. Avancement du nanosatellite NIMPH et de sa charge utile optique-RF pour le test de fibres optiques dopées Erbium. Journée du Club optique Micro-onde 2025 (JCOM 2025), Jun 2025, Toulouse, France. ⟨hal-05186284⟩

2023

Other documents

Nathalie Labat, Nicolas Nolhier. Special issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023. Microelectronics Reliability, 2023, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF. ⟨hal-04709992⟩

2022

Journal articles

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Alexandre Boyer. Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model from TLP Measurements. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (1), pp.47 - 57. ⟨10.1109/TEMC.2021.3106770⟩. ⟨hal-03408285⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level - Part I. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (4), pp.1230 - 1242. ⟨10.1109/TEMC.2022.3169183⟩. ⟨hal-03664433⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (5), pp.1493 - 1505. ⟨10.1109/TEMC.2022.3172601⟩. ⟨hal-03681022⟩

Conference papers

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level. International Symposium on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900970⟩. ⟨hal-03773209⟩

2021

Journal articles

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Transactions on Instrumentation and Measurement, 2021, 70, ⟨10.1109/TIM.2021.3126376⟩. ⟨hal-03423272⟩

Conference papers

Christophe Viallon, Frédéric Camps, Arnaud Fernandez, Olivier Llopis, Nicolas Nolhier, et al.. EDMon nanosat Payload: risk management implementation in hardware and software design. 12th European Cubesat Symposium, Ecole Polytechnique, Nov 2021, Palaiseau, France. ⟨hal-03431647⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Anticipating Common-Mode Conducted Emission of DC-DC Converter from Electric Near-Field Scan. 2021 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY, AND EMC EUROPE, Jul 2021, Glasgow (virtuel), United Kingdom. ⟨10.1109/EMC/SI/PI/EMCEurope52599.2021.9559364⟩. ⟨hal-03321009⟩

Other documents

Nathalie Labat, François Marc, Hélène Frémont, Nicolas Nolhier. Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France. Microelectronics Reliability, pp.114403, 2021, ⟨10.1016/j.microrel.2021.114403⟩. ⟨hal-03408633⟩

2019

Other documents

Nicolas Nolhier, Nathalie Labat, Hélène Frémont, François Marc, Fabrice Caignet, et al.. Proceedings of the 30th European Symposium on the reliability of electron devices, failure physics and analysis. ESREF 2019, Sep 2019, Microelectronics Reliability, 100-101, pp.113498, 2019, ⟨10.1016/j.microrel.2019.113498⟩. ⟨hal-02884107⟩

2018

Books

Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. Méthodologies de protection ESD : du composant au système. ISTE Editions. 280p., 2018, 9781784053260. ⟨hal-01702094⟩

Book sections

Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. Voiture autonome : le défi du zéro défaut pour la fiabilité des systèmes électroniques embarqués. Transports du futur: Regards croisés de chercheur.e.s, 37, pp.20, 2018, Collection Petit illustré. ⟨hal-01980187⟩

Conference papers

Arnaud Fernandez, Christophe Viallon, Nicolas Nolhier, Olivier Llopis, Anthony Coustou, et al.. NIMPH: EDMon (Erbium Doped fiber Monitoring). Journée du Club Opto Microonde, Jul 2018, Toulouse, France. ⟨hal-02022183⟩

Arnaud Fernandez, Olivier Llopis, Christophe Viallon, Nicolas Nolhier, J.-N Perié, et al.. A Nanosatellite Optoelectronic Payload Dedicated to Radiation-Induced Degradation Measurement in Erbium-Doped Fiber. 10th European CubeSat Symposium, Dec 2018, Toulouse, France. ⟨hal-01925595⟩

2017

Journal articles

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectronics Reliability, 2017, 76-77, pp.685 - 691. ⟨10.1016/j.microrel.2017.07.032⟩. ⟨hal-01698397⟩

Books

Marise Bafleur, Fabrice Caignet, Nicolas Nolhier. ESD Protection Methodologies: From Component to System. Elsevier, 284p., 2017, 978-1-78548-122-2. ⟨hal-01613901⟩

Conference papers

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier. LIN communication behaviours against ESD events. 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/EMCEurope.2017.8094675⟩. ⟨hal-01698505⟩

2016

Journal articles

Romain Monthéard, Marise Bafleur, Vincent Boitier, Xavier Dollat, Nicolas Nolhier, et al.. Coupling Supercapacitors and Aeroacoustic Energy Harvesting for Autonomous Wireless Sensing in Aeronautics Applications . Energy Harvesting and Systems, 2016, 3 (4), pp.265-276. ⟨10.1515/ehs-2016-0003⟩. ⟨hal-01497529⟩

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Impact of non-linear capacitances on transient waveforms during system level ESD stress. Microelectronics Reliability, 2016, Proceedings of the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 64, pp.88 - 92. ⟨10.1016/j.microrel.2016.07.046⟩. ⟨hal-01497515⟩

Conference papers

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier. Modélisation de système pour la prédiction de défaillances dues aux décharges électrostatiques. Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2016), May 2016, Toulouse, France. 5p. ⟨hal-01698411⟩

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Présentation d'un travail normatif de modélisation de système pour la prédiction de défaillance ESD. 18 ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2016) , Jul 2016, Rennes, France. 6p. ⟨hal-01698420⟩

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. From quasi-static to transient system level ESD simulation: Extraction of turn-on elements. Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2016 38th, ESD Association, Sep 2016, Anaheim, United States. pp.1 - 10, ⟨10.1109/EOSESD.2016.7592563⟩. ⟨hal-01387072⟩

Arnaud Fernandez, Olivier Llopis, Nicolas Nolhier, Christophe Viallon, Angélique Rissons, et al.. A 3U cubesat to investigate erbium doped fiber degradation at low earth orbit. Avionics and Vehicle Fiber-Optics and Photonics Conference (AVFOP), Oct 2016, Long Beach, United States. ⟨hal-01396269⟩

2015

Journal articles

Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier. Editorial, Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015. Microelectronics Reliability, 2015, 55 (9-10), pp.1269-1270. ⟨10.1016/j.microrel.2015.09.028⟩. ⟨hal-01257965⟩

Books

Philippe Perdu, François Marc, Marise Bafleur, Hélène Fremont, Nicolas Nolhier (Dir.). Microelectronics Reliability Volume 55, Issues 9–10. Volume 55, ( Issues 9–10), 2015, Microelectronics Reliability. ⟨hal-01257945⟩

Book sections

Marise Bafleur, Fabrice Caignet, Nicolas Nolhier, Patrice Besse, Jean-­‐philippe Lainé. Protecting Mixed-­Signal Technologies Against Electrostatic Discharges: Challenges and Protection Strategies from Component to System. Thomas NOULIS. Mixed-signal circuits, CRC PRESS, 40p. Chapter 3, 2015, Devices, Circuits, and Systems Series, 9781482260625. ⟨hal-01218627⟩

Conference papers

Fabrice Caignet, Rémi Bèges, Patrice Besse, Jean-Philippe Lainé, Nicolas Nolhier, et al.. Hierarchical Modeling Approach for System Level ESD Analysis: From Hard to Functional Failure. Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) , May 2015, TAIPEI, Taiwan. 4p., ⟨10.1109/APEMC.2015.7175399⟩. ⟨hal-01843414⟩

Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Dynamic system level ESD current measurement using magnetic field probe. Asia-Pacific International Symposium on Electromagnetic Compatibility ( APEMC ), May 2015, Taipei, Taiwan. ⟨10.1109/APEMC.2015.7175400⟩. ⟨hal-01239444⟩

Arnaud Fernandez, Amadou Gadio, F Destic, Julien Sommer, A Rissons, et al.. The NIMPH Project. 7th CubeSat Symposium , von Karman Institute for Fluid Dynamics, University of Liege, Sep 2015, Liège, Belgium. ⟨hal-01274184⟩

Rémi Bèges, Fabrice Caignet, Patrice Besse, Jean-Philippe Laine, Alain Salles, et al.. TLP-based Human Metal Model stress generator and analysis method of ESD generators. Electrical Overstress / Electrostatic Discharge Symposium (EOS/ESD 2015), Sep 2015, Reno, United States. ⟨10.1109/EOSESD.2015.7314777⟩. ⟨hal-01239451⟩