People

Alexandre Boyer

Alexandre Boyer

Team

ESE : Embedded Systems and Energy

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Latest publications

2024

Journal articles

Alexandre Boyer, Fabrice Caignet. A Pre-Scan Method to Accelerate Near-Field Scan Immunity Tests. IEEE Letters on Electromagnetic Compatibility Practice and Applications, In press, pp.1-1. ⟨10.1109/LEMCPA.2024.3363113⟩. ⟨hal-04445606⟩

Conference papers

Nicolas Castagnet, Alexandre Boyer, Fabien Escudié. Correlation Between Conducted Injection and Near-Field Scan Immunity in the L-Band. 2024 IEEE International Symposium on Electromagnetic Compatibility and 2024 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa), May 2024, Okinawa, Japan. ⟨hal-04618394⟩

Nicolas Castagnet, Fabien Escudié, Alexandre Boyer. Modèle de corrélation entre une tension conduite et une injection champ proche. XXIIIèmes Journées Nationales Microondes, Jun 2024, Antibes, France. ⟨hal-04618410⟩

2023

Conference papers

Alexandre Boyer, Fabrice Caignet. METHODE DE PRE-SCAN POUR ACCELERER LES TEMPS DE MESURE DU SCAN CHAMP PROCHE EN IMMUNITE. 21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France. ⟨hal-04203229⟩

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Olivier Tico, et al.. Analytical Approach of The High Susceptibility Frequencies of a Battery Management System During Direct Power Injection. Methods of Improvement. IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY (EMC+SIPI 2023), Jul 2023, Grand Rapids, United States. ⟨10.1109/EMCSIPI50001.2023.10241599⟩. ⟨hal-04203286⟩

Alexandre Boyer, Sonia Ben Dhia, Sébastien Serpaud. In-Situ and Contactless Evaluation of Performance of Power Converter EMC Filter based on Near-Field Scan Measurement. EMC Europe 2023, Sep 2023, Cracovie (PL), Poland. ⟨hal-04227850⟩

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Mathieu Aribeau. Passive Cell Balancing Impact On Injection Levels During Direct Power injection on Battery Management System. EMC Europe 2023, Sep 2023, Cracovie, Poland. ⟨hal-04227871⟩

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Hiba Mediouni, et al.. UNE ETUDE COMPARATIVE DES NIVEAUX DPI SUR UN CI BMS AVEC UN MODELE ANALYTIQUE DES RESONANCES. 21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France. ⟨hal-04203247⟩

François Ruffat, Fabrice Caignet, Alexandre Boyer, Guillaume Mejecaze, Fabien Escudie, et al.. MÉTHODE D'EXTRACTION RAPIDE ET EFFICACE D'UN MODÈLE DE PROTECTION ESD FACE À DES PHÉNOMÈNES TRANSITOIRES RAPIDES. 21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France. ⟨hal-04203263⟩

Alexandre Boyer, Sébastien Serpaud, Sonia Ben Dhia, Fabio Coccetti. Performance Charaterisation of the Decoupling Capacitor Network using the Near-Field Measurement. EMC Europe 2023, Sep 2023, Cracovie, Poland. ⟨hal-04227864⟩

Nicolas Castagnet, Fabien Escudié, Alexandre Boyer. Modèle d'estimation de la susceptibilité conduite à partir d'une injection champ proche entre 500 MHz et 2 GHz. Dixième Conférence Plénière du GDR Ondes, Dec 2023, Marseille (France), France. ⟨hal-04549173⟩

2022

Journal articles

Alexandre Boyer, Marine Stojanovic, Kévin Loudière, Frédéric Lafon, Sébastien Serpaud. Gestion de l’obsolescence des composants pour la CEM. Techniques de l'Ingénieur, 2022, pp.g7034. ⟨10.51257/a-v1-g7034⟩. ⟨hal-03833072⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (5), pp.1493 - 1505. ⟨10.1109/TEMC.2022.3172601⟩. ⟨hal-03681022⟩

Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Alexandre Boyer. Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model from TLP Measurements. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (1), pp.47 - 57. ⟨10.1109/TEMC.2021.3106770⟩. ⟨hal-03408285⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level - Part I. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (4), pp.1230 - 1242. ⟨10.1109/TEMC.2022.3169183⟩. ⟨hal-03664433⟩

Alexandre Boyer. A Low-Cost RF Detector to Enhance the Direct Power Injection Conducted Immunity Setup. IEEE Letters on Electromagnetic Compatibility Practice and Applications, 2022, 4 (4), pp.108 - 113. ⟨10.1109/LEMCPA.2022.3210876⟩. ⟨hal-03794115⟩

François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. New Measurement Method to Investigated Service Life of Protection Networks exposed to ESD. Microelectronics Reliability, 2022, 33rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ⟨10.1016/j.microrel.2022.114661⟩. ⟨hal-03788175⟩

Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia, Fabio Coccetti. Efficiency of Sequential Spatial Adaptive Sampling Algorithm to Accelerate Multi-Frequency Near-Field Scanning Measurement. IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (3), pp.816 - 826. ⟨10.1109/TEMC.2021.3136096⟩. ⟨hal-03543405⟩

Conference papers

Saliha Chetouani, Alexandre Boyer, Sonia Ben Dhia, Sébastien Serpaud, André Durier. A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change. 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2021), Mar 2022, Brugges, Belgium. ⟨10.1109/EMCCompo52133.2022.9758624⟩. ⟨hal-03654075⟩

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Hiba Mediouni, et al.. A Comparative Study of DPI levels on BMS IC With an On-Hand Analytical Model to Predict Resonances. International Symposium and Exhibition on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9901210⟩. ⟨hal-03773305⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level. International Symposium on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900970⟩. ⟨hal-03773209⟩

Badr Guendouz, Philippe Perruchoud, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia. A Simple Analytical Approximation to evaluate Noise Levels and Maximum Coupling Frequencies During DPI Simulations on BMS IC. Asia Pacific International Conference on EMC (APEMC) 2022, Sep 2022, Beijing, China. ⟨10.1109/APEMC53576.2022.9888479⟩. ⟨hal-03773319⟩

André Durier, Sonia Ben Dhia, Alexandre Boyer, Tristan Dubois. A new Investigation Methodology to predict Far Field Radiated Immunity from Near Field Scan Immunity Measurements. International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900974⟩. ⟨hal-03773310⟩

François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. A fast and efficient Model Extraction Method to predict the transient Response of ESD Protection Devices. International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9901148⟩. ⟨hal-03773211⟩

François Ruffat, Fabrice Caignet, Alexandre Boyer, Fabien Escudié, Guillaume Mejecaze, et al.. New Measurement Method to Investigated Service Life of Protection Networks exposed to ESD. 33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF2022), Sep 2022, Berlin, Germany. ⟨10.1016/j.microrel.2022.114661⟩. ⟨hal-03788168⟩

2021

Journal articles

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Transactions on Instrumentation and Measurement, 2021, 70, ⟨10.1109/TIM.2021.3126376⟩. ⟨hal-03423272⟩

Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia, Fabio Coccetti. Fast and Accurate Near-Field Measurement Method using Sequential Spatial Adaptive Sampling (SSAS) Algorithm. IEEE Transactions on Electromagnetic Compatibility, 2021, 63 (3), pp.858-869. ⟨10.1109/TEMC.2020.3025547⟩. ⟨hal-02967998⟩

Estevan L Lara, Allan A Constante, Juliano Benfica, Fabian Vargas, Alexandre Boyer, et al.. Impact of place and route strategy on FPGA electromagnetic emission. Microelectronics Reliability, 2021, 126, pp.114333. ⟨10.1016/j.microrel.2021.114333⟩. ⟨hal-03466580⟩

Alexandre Boyer, Sonia Ben Dhia. Low-Cost Broadband Electronic Coupler for Estimation of Radiated Emission of Integrated Circuits in TEM Cell. IEEE Transactions on Electromagnetic Compatibility, 2021, 63 (2), pp.636-639. ⟨10.1109/TEMC.2020.3021135⟩. ⟨hal-02937460⟩

Conference papers

Estevan Lara, Allan Constante, Juliano Benfica, Fabian Vargas, Alexandre Boyer, et al.. Preliminary Study on the Impact of Place and Route Strategy on FPGA Electromagnetic Emission. 2021 Argentine Conference on Electronics (CAE2021), Mar 2021, Bahia Blanca (Virtual), Argentina. ⟨10.1109/CAE51562.2021.9397567⟩. ⟨hal-03206144⟩

Saliha Chetouani, Alexandre Boyer, Sébastien Serpaud, Sonia Ben Dhia. APPLICATION DES METHODES DE MESURES INDIRECTES DE PARAMETRES " S " EN VUE DE LA GESTION DE L'OBSOLESCENCE DES COMPOSANTS EN IMMUNITE CONDUITE. 20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021, Apr 2021, Lyon (virtuel), France. ⟨hal-03201537⟩

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Anticipating Common-Mode Conducted Emission of DC-DC Converter from Electric Near-Field Scan. 2021 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY, AND EMC EUROPE, Jul 2021, Glasgow (virtuel), United Kingdom. ⟨10.1109/EMC/SI/PI/EMCEurope52599.2021.9559364⟩. ⟨hal-03321009⟩

Alexandre Boyer, André Durier, Sonia Ben Dhia. UNE NOUVELLE SONDE DE MESURE DE TENSION INDUITE POUR L'INVESTIGATION EN IMMUNITE RAYONNEE. 20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021, Apr 2021, Lyon (Virtuel), France. ⟨hal-03201536⟩

2020

Conference papers

Saliha Chetouani, Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Fast and efficient approach to predict EMC immunity of complex equipment after a component change. EMC Europe 2020, Sep 2020, Rome (online), Italy. ⟨hal-02951845⟩

Alexandre Boyer, Sonia Ben Dhia, André Durier. A new Voltage Measurement Probe for investigating Radiated Immunity Test. EMC Europe 2020, Sep 2020, Rome (virtual), Italy. ⟨hal-02951842⟩

2019

Journal articles

Chaimae Ghfiri, Alexandre Boyer, Alain Bensoussan, André Durier, Sonia Ben Dhia. A new methodology for EMC prediction of integrated circuits after aging. IEEE Transactions on Electromagnetic Compatibility, 2019, 61 (2), pp.572-581. ⟨10.1109/TEMC.2018.2819722⟩. ⟨hal-01951615⟩

Conference papers

Sebastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Optimized algorithm to reduce the near-field measurement time on FPGA device. 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2019), Oct 2019, Haining, China. ⟨hal-02319472⟩

Alexandre Boyer, E. Sicard. A Case Study to apprehend RF Susceptibility of Operational Amplifiers. 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2019), Oct 2019, Haining, China. ⟨hal-02319469⟩

Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Sequential adaptive sampling algorithm to reduce the near field measurement time. International Symposium on Electromagnetic Compatibility (EMC Europe 2019), Sep 2019, Barcelona, Spain. ⟨hal-02319466⟩

Nabil El Belghiti Alaoui, Anais Cassou, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. Using infrared thermal responses for PCBA production tests: Feasibility study. 30 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Sep 2019, Toulouse, France. ⟨hal-02319468⟩

Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. Detecting PCB Assembly defects using infrared thermal signatures. 27th International Conference Mixed Design of Integrated Circuits and Systems (MIXDES2019), Jun 2019, Wroclaw, Poland. ⟨10.23919/MIXDES.2019.8787089⟩. ⟨hal-02319460⟩

Alexandre Boyer. A Rigorous Method to extrapolate Radiated Susceptibility from Near-Field Scan Immunity. International Symposium on Electromagnetic Compatibility (EMC Europe 2019), Sep 2019, Barcelona, Spain. ⟨hal-02319463⟩

Etienne Sicard, Alexandre Boyer. Impact of Technological Trends and Electromagnetic Compatibility of Integrated Circuits. EMC Compo 2019, Oct 2019, Haining, China. ⟨hal-02403882⟩

PhD thesis, HDR

Alexandre Boyer. Contribution à la caractérisation et la modélisation de la CEM des circuits intégrés. Electronique. Université Paul Sabatier - Toulouse III, 2019. ⟨tel-02327898⟩

2018

Journal articles

Chaimae Ghfiri, Alexandre Boyer, André Durier, Sonia Ben Dhia. A new methodology to build the Internal Activity Block of ICEM-CE for complex Integrated Circuits. IEEE Transactions on Electromagnetic Compatibility, 2018, 60 (5), pp.1500-1509. ⟨10.1109/TEMC.2017.2767084⟩. ⟨hal-01659770⟩

Stéphane Gaudry, David Hajage, Frederique Schortgen, Laurent Martin-Lefevre, Charles Verney, et al.. Timing of Renal Support and Outcome of Septic Shock and Acute Respiratory Distress Syndrome. A Post Hoc Analysis of the AKIKI Randomized Clinical Trial. American Journal of Respiratory and Critical Care Medicine, 2018, 198 (1), pp.58-66. ⟨10.1164/rccm.201706-1255OC⟩. ⟨hal-02616898⟩

Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard. Upgrading In-Circuit Test of high density PCBAs using electromagnetic measurement and Principal Component Analysis. Journal of Electronic Testing: : Theory and Applications, 2018, 34 (6), pp.749-762. ⟨10.1007/s10836-018-5763-4⟩. ⟨hal-01944924⟩

Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, A. Viard. New defect detection approach using near electromagnetic field probing of high density PCBAs. Microelectronics Reliability, 2018, 88-90, pp.288-293. ⟨10.1016/j.microrel.2018.07.090⟩. ⟨hal-01885517⟩

Conference papers

Nabil El-Belghiti, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. 27th IEEE North Atlantic Test Workshop, May 2018, Essex, United States. ⟨10.1109/NATW.2018.8388867⟩. ⟨hal-01997428⟩

Chaimae Ghfiri, André Durier, C. Marot, Alexandre Boyer, Sonia Ben Dhia. Modeling the internal activity of an FPGA for conducted emission prediction purpose. 2018 Joint IEEE EMC & APEMC Symposium, May 2018, Singapour, Singapore. 6p. ⟨hal-01839745⟩

Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. New defect detection approach using near electromagnetic field probing for high density PCBAs New defect detection approach using near electromagnetic field probing of high density PCBAs. 29 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark. ⟨10.1016/j.microrel.2018.07.090⟩. ⟨hal-02319457⟩

2017

Books

Alexandre Boyer, Etienne Sicard. Basis of Electromagnetic Compatibility of Integrated Circuits - A modeling approach using IC-EMC. Presses Universitaires du Midi - Collection Pour l'ingénieur. Presses universitaires du Midi (PUM), 390p., 2017, 978-2-8107-0522-1. ⟨hal-01951651⟩

Conference papers

Alexandre Boyer, Chaimae Ghfiri, André Durier. ICEM Generator – A tool for the construction of IC emission models. EMC Europe 2017, Sep 2017, Angers, France. 14p. ⟨hal-01598931⟩

Sébastien Serpaud, Chaimae Ghfiri, Alexandre Boyer, A Durier. Proposal for combined conducted and radiated emission modelling for Integrated Circuit. 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourg, Russia. pp.172-177, ⟨10.1109/EMCCompo.2017.7998105⟩. ⟨hal-01574387v2⟩

Chaimae Ghfiri, André Durier, Alexandre Boyer, Sonia Ben Dhia. A new methodology to extract the ICEM-CE internal activity block of a FPGA. EMC Europe, Sep 2017, Angers, France. pp. 1-6. ⟨hal-01661809⟩

Nicolas Lacrampe, Sebastien Serpaud, Alexandre Boyer, Séreirath Tran. Radiated suceptibility investigation of electronic board from near field scan method. 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourg, Russia. pp.125-130, ⟨10.1109/EMCCompo.2017.7998096⟩. ⟨hal-01574389⟩

Chaimae Ghfiri, André Durier, Christian Marot, Alexandre Boyer, Sonia Ben Dhia. Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose. 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourgh, Russia. 6p. ⟨hal-01574384⟩

Alexandre Boyer, Etienne Sicard. Learning EMC of ICs with IC-EMC. EMC Europe 2017, Sep 2017, Angers, France. 20p. ⟨hal-01598932⟩

Sébastien Serpaud, Chaimae Ghfiri, Alexandre Boyer, André Durier. Comparison of extraction methods to build a radiated emission model of ICs (ICEM-RE): pros and cons . EMC Europe 2017 , Sep 2017, Angers, France. 23p. ⟨hal-01598948⟩

Chaimae Ghfiri, Alexandre Boyer, Andre Durier, Sonia Ben Dhia. Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose. Congrès de l'école doctorale GEET, Mar 2017, Toulouse, France. 6p. ⟨hal-01500303⟩

Alexandre Boyer, Manuel Antero Gonzalez Sentis, Chaimae Ghfiri, André A Durier. Modeling methodology of the conducted emission of a DC-DC converter board. 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourg, Russia. pp.73-78, ⟨10.1109/EMCCompo.2017.7998085⟩. ⟨hal-01574376⟩

Alexandre Boyer, Manuel Antero Gonzalez Sentis, Chaimae Ghfiri, André Durier. Study of the thermal aging effect on the conducted emission of a synchronous buck converter. EMC Compo (The 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits), Jul 2017, Saint Petersburg, Russia. pp. 79-84. ⟨hal-01649708⟩

Other documents

Etienne Sicard, Alexandre Boyer. IC-EMC User's Manual. 2017. ⟨hal-01574395⟩

2016

Journal articles

Elisabeth Coupez, Jean-François Timsit, Stephane Ruckly, Carole Schwebel, Didier Gruson, et al.. Guidewire exchange vs new site placement for temporary dialysis catheter insertion in ICU patients: is there a greater risk of colonization or dysfunction?. Critical Care, 2016, 20 (1), pp.230. ⟨10.1186/s13054-016-1402-6⟩. ⟨hal-01844411⟩

Conference papers

Alexandre Boyer, He Huang, Sonia Ben Dhia. Predicting the risk of non-compliance to EMC requirements during the life-cycle. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.452 - 455, ⟨10.1109/APEMC.2016.7522766⟩. ⟨hal-01403875⟩

Alexandre Boyer. AMELIORATION DE LA RESOLUTION SPATIALE DE SCAN CHAMP PROCHE EN INJECTION. 18e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2016, Jul 2016, Rennes, France. ⟨hal-01403886⟩

Sonia Ben Dhia, Alexandre Boyer. A Review of Research on the Effect of Aging on the EMC of Integrated Circuits. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC 2016), May 2016, Shenzhen, China. ⟨10.1109/APEMC.2016.7522971⟩. ⟨hal-01403874⟩

Andre Durier, Alexandre Boyer, Geneviève Duchamp. A methodologic project to characterize and model COTS components EMC behavior after ageing. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.376 - 379, ⟨10.1109/APEMC.2016.7522742⟩. ⟨hal-01698337v2⟩

Alexandre Boyer. Improving spatial resolution of immunity maps by post-processing. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.56 - 59, ⟨10.1109/APEMC.2016.7522794⟩. ⟨hal-01403868⟩

Chaimae Ghfiri, Alexandre Boyer, André Durier, Sonia Ben Dhia, C Marot. Construction d'un modèle ICEM pour prédire l'émission électromagnétique d'un FPGA. 18e Colloque International et Exposition sur la Compatibilité Electromagnétique (CEM2016), Jul 2016, Rennes, France. 5p. ⟨hal-01403883⟩

Chaimae Ghfiri, André Durier, Alexandre Boyer, Sonia Ben Dhia, Christian Marot. Construction of an Integrated Circuit Emission Model of a FPGA. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.402-405, ⟨10.1109/APEMC.2016.7522751⟩. ⟨hal-01663667v2⟩

2015

Journal articles

Alexandre Boyer, Bertrand Vrignon, Manuel Cavarroc. Modeling Magnetic Near-Field Injection at Silicon Die Level. IEEE Transactions on Electromagnetic Compatibility, 2015, 58 (1), pp. 257-269. ⟨10.1109/TEMC.2015.2486041⟩. ⟨hal-01225324⟩

Bertrand Souweine, Alexandre Lautrette, Didier Gruson, Emmanuel Canet, Kada Klouche, et al.. Ethanol Lock and Risk of Hemodialysis Catheter Infection in Critically Ill Patients. A Randomized Controlled Trial. American Journal of Respiratory and Critical Care Medicine, 2015, 191 (9), pp.1024 - 1032. ⟨10.1164/rccm.201408-1431OC⟩. ⟨hal-01394021⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. Microelectronics Reliability, 2015, 55 (9-10), pp.2050-2054. ⟨10.1016/j.microrel.2015.07.008⟩. ⟨hal-01225338⟩

André Durier, Alain Bensoussan, Moustafa Zerarka, Chaimae Ghfiri, Alexandre Boyer, et al.. A methodologic project to characterize and model COTS component reliability. Microelectronics Reliability, 2015, 55 (9-10), pp.2097-2102. ⟨10.1016/j.microrel.2015.06.140⟩. ⟨hal-01582570⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter. Microelectronics Reliability, 2015, 55 (9-10), pp. 2061-2066. ⟨10.1016/j.microrel.2015.06.058⟩. ⟨hal-01225333⟩

Conference papers

He Huang, Alexandre Boyer, Sonia Ben Dhia, Bertrand Vrignon. Prediction of Aging Impact on Electromagnetic Susceptibility of an Operational Amplifier. Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p. ⟨hal-01159222⟩

Rachid Omarouayache, Jérémy Raoult, Pierre Payet, Laurent Chusseau, Bertrand Vrignon, et al.. Modèle d'injection électromagnétique en champ proche sur circuit intégré. 19èmes Journées Nationales Microondes - JNM 2015, Jun 2015, Bordeaux, France. ⟨hal-01892688⟩

Alexandre Boyer, He Huang, Sonia Ben Dhia. ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. ⟨hal-01225377⟩

Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, et al.. Developing a Universal Exchange Format for Integrated Circuit Emission Model – Conducted Emissions. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p. ⟨hal-01225367⟩

Etienne Sicard, Alexandre Boyer. EMC modeling of Integrated Circuits using IC-EMC. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 2p. ⟨hal-01225370⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter. EMC Europe 2015, Aug 2015, Dresden, Germany. 6p. ⟨hal-01225350⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Analysis and Modelling of Passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France. ⟨hal-01225352⟩

Marc Veljko Thomas Tomasevic, Alexandre Boyer, Sonia Ben Dhia. Development of an On-Chip Sensor for Substrate Coupling Study in Smart Power Mixed ICs. Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p. ⟨hal-01159221⟩

Alexandre Boyer, Sonia Ben Dhia. Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends. Minapad Forum 2015, Apr 2015, Grenoble, France. 6p. ⟨hal-01159227⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. Electronic counterfeit detection based on the measurement of electromagnetic fingerprint Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France. ⟨hal-01225354⟩

Rachid Omarouayache, Jérémy Raoult, Pierre Payet, Laurent Chusseau, Bertrand Vrignon, et al.. Electromagnetic near field injection model on integrated circuit. Progress In Electromagnetics Research Symposium (PIERS 2015), Jul 2015, Prague, Czech Republic. ⟨hal-01892684⟩

Marc Veljko Thomas Tomasevic, Alexandre Boyer, Sonia Ben Dhia. Bandgap Failure Study Due To Parasitic Bipolar Substrate Coupling In Smart Power Mixed ICs. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 5p. ⟨hal-01225358⟩

Marc Veljko Thomas Tomasevic, Alexandre Boyer, Sonia Ben Dhia, Alexander Steinmar, Weiss B., et al.. Coupling study in smart power mixed ICs with a dedicated on-chip sensor. EMC Europe 2015, Aug 2015, Dresden, Germany. ⟨10.1109/ISEMC.2015.7256236⟩. ⟨hal-01225345⟩

Alexandre Boyer, Manuel Cavarroc. Enhancement of the Spatial Resolution of Near-Field Immunity Maps. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p. ⟨hal-01225356⟩

Etienne Sicard, Alexandre Boyer, Priscillia Fernandez-Lopez, An Zhou, Nicolas Marier, et al.. EMC performance analysis of a Processor/Memory System using PCB and Package-On-Package. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p. ⟨hal-01225364⟩

Alexandre Boyer, B Vrignon, Manuel Cavarroc, J Shepherd. Near-Field Injection At Die Level. Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. ⟨hal-01159220⟩

2014

Journal articles

A.-G. Venier, C. Leroyer, C. Slekovec, D. Talon, X. Bertrand, et al.. Risk factors for Pseudomonas aeruginosa acquisition in intensive care units: a prospective multicentre study.. Journal of Hospital Infection, 2014, 88 (2), pp.103-108. ⟨10.1016/j.jhin.2014.06.018⟩. ⟨hal-01061604⟩

Alexandre Boyer, Sonia Ben Dhia. Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits. Journal of Low Power Electronics, 2014, 10 (1), pp.165-172. ⟨hal-00938358⟩

Damien Roux, Jean Reignier, Guillaume Thiery, Alexandre Boyer, Jan Hayon, et al.. Acquiring procedural skills in ICUs: a prospective multicenter study*.. Critical Care Medicine, 2014, 42 (4), pp.886-95. ⟨10.1097/CCM.0000000000000049⟩. ⟨hal-01053800⟩

José Medrano, Alejando Álvaro-Meca, Alexandre Boyer, Maria A Jiménez-Sousa, Salvador Resino. Mortality of patients infected with HIV in the intensive care unit (2005 through 2010): significant role of chronic hepatitis C and severe sepsis. Critical Care, 2014, 348, pp.1546. ⟨10.1186/s13054-014-0475-3⟩. ⟨inserm-01097959⟩

Jianfei Wu, Alexandre Boyer, Jiancheng Li, Bertrand Vrignon, Etienne Sicard, et al.. Modeling and Simulation of LDO Voltage Regulator Susceptibility to Conducted EMI. IEEE Transactions on Electromagnetic Compatibility, 2014, 56 (3), pp.726-735. ⟨10.1109/TEMC.2013.2294951⟩. ⟨hal-01159232⟩

Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Nestor Berbel, Raul Fernandez-Garcia. Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits. IEEE Transactions on Electromagnetic Compatibility, 2014, 56 (1), pp. 44-50. ⟨10.1109/TEMC.2013.2272195⟩. ⟨hal-00937775⟩

Conference papers

He Huang, Alexandre Boyer, Sonia Ben Dhia. IMPACT DU VIEILLISSEMENT THERMIQUE SUR L'EMISSION D'UN CONVERTISSEUR BUCK. 17ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2014), Jul 2014, Clermont-Ferrand, France. pp.1-5. ⟨hal-01068132⟩

Sonia Ben Dhia, Alexandre Boyer. Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing. Test Workshop - LATW, 2014 15th Latin American, Mar 2014, Fortaleza, Brazil. pp.1-6. ⟨hal-01017384⟩

Marc Veljko Thomas Tomasevic, Alexandre Boyer, Sonia Ben Dhia. DEVELOPPEMENT D'UN CAPTEUR SUR PUCE AFIN D'ETUDIER LE COUPLAGE PARASITE DANS LES CIRCUITS INTEGRES DE TYPE " SMART POWER ". 17ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2014), Jul 2014, Clermont-Ferrand, France. pp.1-5. ⟨hal-01068133v2⟩

Clément Crémoux, Alexandre Boyer, Karim Ben Dhia. Reliability of active RFID tag immersed in water for anti-kidnapping applications. 2014 IEEE-APS Topical Conference on Antennas and Propagation in Wireless Communications (APWC), Aug 2014, Aruba, Aruba. pp.40-43. ⟨hal-01068122⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia. The detection of counterfeit integrated circuit by the use of electromagnetic fingerprint. EMC Europe 2014, Sep 2014, Gothenburg, Sweden. pp.1-5. ⟨hal-01068129⟩

Alexandre Boyer, He Huang, Sonia Ben Dhia. Impact of thermal aging on emission of a buck DC-DC converter. 2014 International Symposium on Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo), May 2014, Tokyo, Japan. pp.77-80. ⟨hal-01006115⟩

Alexandre Boyer, Bertrand Vrignon, John Shepherd, Manuel Cavarroc. Evaluation of the Near-Field Injection Method at Integrated Circuit Level. EMC Europe 2014, Sep 2014, Goteborg, Sweden. pp.1-6. ⟨hal-01068126⟩

Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, et al.. Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI). VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004189⟩. ⟨lirmm-01434592⟩

He Huang, Alexandre Boyer, Sonia Ben Dhia, Bertrand Vrignon. Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement. EMC Europe 2014, Sep 2014, Goteborg, Sweden. pp.1-5. ⟨hal-01068127⟩