Publications personnelle

74documents trouvés

09818
01/05/2009

Diviseur de fréquence SiGe:C 0,25 µm, large bande et faible bruit, pour banc de mesure de bruit de phase intégré

S.GODET, E.TOURNIER, O.LLOPIS, J.JUYON, A.CATHELIN

MOST, ST Microelectronics

Manifestation avec acte : 16ème Journées Nationales Microondes (JNM 2009), Grenoble (France), 27-29 Mai 2009, 4p. , N° 09818

Lien : http://hal.archives-ouvertes.fr/hal-00391658/fr/

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121273
07816
27/03/2009

Circuit électronique comprenant un dispositif de mesure du bruit de phase d'un dispositif oscillant et/ou résonant

A.CATHELIN, S.GODET, O.LLOPIS, E.TOURNIER, S.THURIES

MOST, ST Microelectronics

Brevet : FR 2921493 (A1), Mars 2009, 43p. , N° 07816

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115582
08632
01/01/2009

A low phase noise and wide-bandwith biCMOS SiGe:C 0.25um digital frequency divider for an on-chip phase-noise measurement circuit

S.GODET, E.TOURNIER, O.LLOPIS, A.CATHELIN, J.JUYON

MOST, ST Microelectronics

Manifestation avec acte : 9th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SIRF 2009), San Diego (USA), 19-21 Janvier 2009, 4p. , N° 08632

Lien : http://hal.archives-ouvertes.fr/hal-00358067/fr/

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Abstract

A low phase noise and wide-bandwidth frequency divider has been developed in a 0.25 ¼m SiGe:C process. This paper discusses the BiCMOS design improvements used for ultra low phase noise applications like on-chip phase-noise measurement circuit. From a singleended signal provided by a local oscillator LO, the widebandwidth frequency divider circuit generates accurate quadrature signals. For the full 1kHz-5.5 GHz input frequency range, the frequency divider achieves an output quadrature error less than ±1°. This paper presents a novel architecture designed for improving phase noise and exhibits a measured residual phase noise of -164 dBc/Hz @ 100 kHz with a 3.5 GHz input frequency.

Mots-Clés / Keywords
On-chip phase-noise measurement circuit; Silicon bipolar/BiCMOS process technology; RF analog circuits; Low phase noise; Frequency divider;

116313
08633
01/01/2009

A baseband ultra-low noise SiGe: C BiCMOS 0.25 um amplifier and its application for an on-chip phase-noise measurement circuit

S.GODET, E.TOURNIER, O.LLOPIS, A.CATHELIN, J.JUYON

MOST, ST Microelectronics

Manifestation avec acte : 9th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SIRF 2009), San Diego (USA), 19-21 Janvier 2009, pp.128-4131 , N° 08633

Lien : http://hal.archives-ouvertes.fr/hal-00358083/fr/

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Abstract

The design and realization of an ultra-low noise operational amplifier is presented. Its applications are integrated low-frequency noise measurements in electronic devices and onchip phase-noise measurement circuit. This paper discusses the SiGe:C BiCMOS 0.25 ¼m design improvements used for low noise applications. The proposed three-stage operational amplifier uses parallel bipolar transistor connection as input differential pair for low noise behavior. This operational amplifier provides both low noise and high gain performances. This operational amplifier has an area of only 660×250 ¼m2 with an equivalent input noise floor of only 1.1 nV/Hz square root at 10 kHz. The measured noise characteristics (versus total power consumption) are better than those of most operational amplifiers commonly adopted in low-frequency noise measurements. The AC gain is 83 dB and the unity gain bandwidth is 210 MHz, with a total current consumption of 18 mA at 2.5 V supply voltage.

116314
08228
01/04/2008

An automated measurement bench for integrated baw resonators nonlinear characterization at microwave frequencies

S.GODET, S.GRIBALDO, E.TOURNIER, O.LLOPIS, A.REINHARDT, J.B.DAVID

MOST, CEA

Manifestation avec acte : The European Forum for Time and Frequency 08. Toulouse Space Show'08, Toulouse (France), 22-25 Avril 2008, 4p. , N° 08228

Lien : http://hal.archives-ouvertes.fr/hal-00276162/fr/

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Abstract

A test set-up for the characterization of microwave BAW resonators driven into nonlinear regime is presented. In this set-up, a network analyser is coupled to a spectrum analyser, in order to measure simultaneously the resonant frequencies and the nonlinear behaviour (harmonic generation). A power amplifier (5 W) is used at the network analyser output, because this nonlinear behaviour can only be observed at high power. Finally, the set-up is used to evaluate these properties on a set of SMR resonators.

Mots-Clés / Keywords
Microwave resonator; Microwave measurements; Piezoelectric resonator; BAW; SMR; Nonlinear measurement;

113736
06550
16/01/2008

A 6-GHz low-power BiCMOS SiGe:C 0.25 um direct digital synthesizer

S.THURIES, E.TOURNIER, A.CATHELIN, S.GODET, J.GRAFFEUIL

MOST, ST Microelectronics

Revue Scientifique : IEEE Microwave and Wireless Components Letters, Vol.18, N°1, pp.46-48, Janvier 2008 , N° 06550

Lien : http://hal.archives-ouvertes.fr/hal-00257982/fr/

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Abstract

A 6-GHz low power SiGe direct digital synthesizer (DDS) is reported. This letter discusses the BiCMOS design improvements used for the phase accumulator and the phase-to-amplitude conversion in order to achieve higher speed operation and lower power consumption compared to existing DDS. The phase accumulator is based on a three-level BiCMOS logic, and the phase-to-amplitude conversion is completed through a bipolar differential pair. The circuit has been processed in a BiCMOS SiGe:C 0.25 $mu$m technology. The power consumption is 308 mW and it operates from a 2.8 V supply. The chip core area is 1 mm$^2$.

Mots-Clés / Keywords
BiCMOS; SiGe; Direct digital synthesizer; Synthesizer;

112602
07788
01/05/2007

Simulation de la transposition du spectre de bruit

S.GODET, E.TOURNIER, O.LLOPIS

MOST

Manifestation avec acte : Journées Nationales des Microondes (JNM 2007), Toulouse (France), 23-25 Mai 2007, 2p. , N° 07788

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Résumé

Cette présentation traite de la simulation en bruit de récepteurs homodynes, ou de discriminateurs de fréquence. Cette simulation est rendue difficile par la non prise en compte, par de nombreux simulateurs, du bruit au voisinage de la fréquence nulle. Notre approche utilise le simulateur Eldo-RF, et a été testée aussi bien pour la détection de phase (ou la mesure de bruit de phase résiduel) que pour la mesure de fréquence (mesure d'oscillateurs). Elle ouvre la voie vers l'optimisation de ces dispositifs.

112960
06551
10/12/2006

A 3-bits DDS oriented low power consumption 15 GHz phase accumulator in a 0.25 um BiCMOS SiGe:C technology

S.THURIES, E.TOURNIER, J.GRAFFEUIL

MOST

Manifestation avec acte : 13th IEEE International Conference on Electronics, Circuits and Systems (ICECS'2006), Nice (France), 10-13 Décembre 2006, 4p. , N° 06551

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109013
06758
01/12/2006

Silicon technologies for applications up to millimetre-waves: some design guidelines

C.VIALLON, E.TOURNIER, T.PARRA

MOST

Revue Scientifique : Analog Integrated Circuits and Signal Processing, Vol.49, N°3, pp.229-236, Décembre 2006 , N° 06758

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108464
06340
01/11/2006

Experimental study of phase noise in FBAR resonators

S.GRIBALDO, C.CHAY, E.TOURNIER, O.LLOPIS

MOST

Revue Scientifique : IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Vol.53, N°11, pp.1982-1987, Novembre 2006 , N° 06340

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108328
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