69documents trouvés
Self-configuration and reachability metrics in massively defective multiport chips
P.ZAJAC, J.H.COLLET, A.NAPIERALSKI
TSF, Lodz
Manifestation avec acte : 14th IEEE International On-Line Testing Symposium (IOLTS 2008), Rhodes (Grèce), 7-9 Juillet 2008, 6p. , N° 08082
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Mots-Clés / Keywords
Fault tolerance; Self-testing; Ultra-large-scale integration; Nanotechnology;
Fault tolerance of the Input/Output ports in massively defective multicore processor chips
P.ZAJAC, J.H.COLLET, J.ARLAT, Y.CROUZET
TSF
Manifestation avec acte : 2nd Workshop on Dependable & Secure Nanocomputing, Anchorage (USA), 27 Juin 2008, 5p. , N° 08188
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Abstract
This paper addresses the fault tolerance issues concerning the input-output ports (IOPs) of future multicore chips built up using massively defective nanotechnologies. Recall that the IOPs are critical to system dependability as they constitute bottlenecks for all communications between the chip and external resources. Various levels of modular redundancy in the IOPs are being considered for which we calculate the probability to maintain correct operation. We also calculate the cost attached to the proposed protective designs for the IOP, in terms of circuitry overhead.
Mots-Clés / Keywords
Ultra-large-scale integration; Nanotechnology; Multicore processor architecture; Fault tolerance;
Fault-tolerance in massively defective multicore grids through self-configuration
P.ZAJAC, J.H.COLLET
TSF
Rapport LAAS N°08097, Mars 2008, 8p.
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Mots-Clés / Keywords
Fault tolerance; Self-testing; Ultra-large-scale integration;
Order-disorder alternations in the populations of faulty repulsive agents
J.H.COLLET
TSF
Revue Scientifique : Physica A, Vol.386, N°1, pp.345-364, Décembre 2007 , N° 06541
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Abstract
We study the spatio-temporal evolution of populations made up from a few tens to thousands of monokinetic repulsive agents moving through a two-dimensional grid. We adopt the behavioral description of agents, in which each agent executes an action following a state automaton. In the first step, the agents follow the repulsion rule of a deterministic automaton. Collective behaviors are calculated from the application of the evolution mechanisms for each individual. We show that, depending on the repulsion law and on the presence of borders, the agents become organized into a square or a condensed hexagonal stationary lattice, which maximizes the potential function of the distribution. Thus, the repulsion may force the condensation to the same site. Then, we study the collective behaviors when the agents are faulty and randomly violate the repulsion law. When the number of agents is small (say, for population involving a few tens of agents), we observe fast and random alternations between the ordered lattice phase and a strongly disorganized state. These alternations are essentially averaged and disappear in the large populations, resulting in a partially ordered homogeneous distribution.
Onchip-network self-configuration in massively defective multiports grids
J.H.COLLET, P.ZAJAC
TSF
Rapport LAAS N°07741, Décembre 2007, 8p.
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Mots-Clés / Keywords
Fault tolerance; Self-testing; Ultra-large-scale integration; Nanotechnology;
Production yield and self-configuration in the future massively defective nanochips
P.ZAJAC, J.H.COLLET
TSF
Manifestation avec acte : The 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'07), Rome (Italie), 26-28 Septembre 2007, pp.197-205 , N° 07325
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Abstract
We address two problems in this work, namely, 1) the resilience challenge in the future chips made up of massively defective nanoelements and organized in replicative multicore architectures and 2) the issue of preserving the production yield. Our main suggestion is that the chip should be self-configuring at the architectural level, enabling with almost no external control mechanisms, core mutual-test to isolate the defective core and self-configuration of communications to discover the routes in the defective network. Our contribution is a systematic study of the dependence of the production yield versus the core failure probability (possibly as high as 0.4) in several networks with different node connectivity ranging from 3 to 5. The result is obtained in terms of a probabilistic metrics to warrant that a minimal fraction of nodes can be contacted by the input-output port for participating to the processing.
Resilience, production yield and self-configuration in the future massively defective nanochips
J.H.COLLET, P.ZAJAC
TSF
Conférence invitée : 13th IEEE International On-Line Testing Symposium (IOLTS 2007), Hersonissos (Grèce), Juillet 2007, 1p. , N° 07320
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110826Resilience through self-configuration in the future massively defective nanochips
P.ZAJAC, J.H.COLLET, J.ARLAT, Y.CROUZET
TSF
Manifestation avec acte : 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2007), Edimbourg (UK), 25-28 Juin 2007, pp.266-271 , N° 07154
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110571A multilayer approach to dependability in massively-defective general-purpose nanoarchitectures
J.H.COLLET, P.ZAJAC
TSF, Lodz
Rapport LAAS N°06538, Septembre 2006, 14p.
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107644Contribution of communications to dependability in massively-defective general-purpose nanoarchitectures
J.H.COLLET, P.ZAJAC, Y.CROUZET, A.NAPIERALSKI
TSF, Lodz
Manifestation avec acte : 12th IEEE International On-Line Testing Symposium (IOLTS'2006°, Como (Italie), 10-12 Juillet 2006, pp.219-226 , N° 06059
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