Publications personnelle

359documents trouvés

12672
13/12/2012

Vers une optimisation fonctionnelle des dispositifs à grande bade interdite GaN: exploitation du bruit basse et haute fréquence, et corrélation avec d'autres techniques de caractérisation

J.G.TARTARIN, S.KARBOYAN, S.NSELE, T.NOUTSA DJOKO, L.ESCOTTE, J.GRAFFEUIL, D.CARISETTI, S.PIOTROWICZ, B.LAMBERT

MOST, THALES R&T, ALCATEL THALES III-V, UMS

Manifestation avec acte : Journées de la Matière Condensée ( JMC ) 2012 du 27 août au 31 août 2012, Montpellier (France), Décembre 2012, 1p. , N° 12672

Diffusable

128713
08580
09/04/2010

Procédé et système de génération d'un signal impulsionnel du type à bande ultra large

A.CATHELIN, S.THURIES, S.GODET, E.TOURNIER, J.GRAFFEUIL

ST Microelectronics, MOST

Brevet : FR 2936918 (A1) le 9 avril 2010 FR 2936918 (B1) le 22 octobre 2010 WO 2010040740 (A1) le 15 avril 2010, Avril 2010, 20p. , N° 08580

Diffusable

126787
09684
01/01/2010

Cyclostationary shot noise measurements in RF schottky barrier diode detectors

J.GRAFFEUIL, R.ALI LIMAN, J.L.MURARO, O.LLOPIS

Thalès Alenia Space, MOST

Revue Scientifique : IEEE Electron Devices Letters, Vol.31, N°1, pp.74-76, Janvier 2010 , N° 09684

Diffusable

122021
09392
28/09/2009

Noise in sampling phase detectors for RF PLL

R.ALI LIMAN, J.L.MURARO, P.LAUTIER, O.LLOPIS, J.GRAFFEUIL

MOST, Thalès Alenia Space

Manifestation avec acte : 39th European Microwave Conference : European Microwave week 2009 (EuMA: EuMC), Rome (Italie), 28 Septembre-2 octobre 2009, pp.480-483 , N° 09392

Diffusable

119097
09305
01/05/2009

Bruit dans les détecteurs de phase à échantillonage pour boucle à verrouillage de phase RF

R.ALI LIMAN, J.L.MURARO, P.LAUTIER, O.LLOPIS, J.GRAFFEUIL

MOST, Thalès Alenia Space

Manifestation avec acte : 16èmes Journées Nationales Microondes (JNM 2009), Grenoble (France), 27-29 Mai 2009, 4p. , N° 09305

Diffusable

117907
06550
16/01/2008

A 6-GHz low-power BiCMOS SiGe:C 0.25 um direct digital synthesizer

S.THURIES, E.TOURNIER, A.CATHELIN, S.GODET, J.GRAFFEUIL

MOST, ST Microelectronics

Revue Scientifique : IEEE Microwave and Wireless Components Letters, Vol.18, N°1, pp.46-48, Janvier 2008 , N° 06550

Lien : http://hal.archives-ouvertes.fr/hal-00257982/fr/

Diffusable

Plus d'informations

Abstract

A 6-GHz low power SiGe direct digital synthesizer (DDS) is reported. This letter discusses the BiCMOS design improvements used for the phase accumulator and the phase-to-amplitude conversion in order to achieve higher speed operation and lower power consumption compared to existing DDS. The phase accumulator is based on a three-level BiCMOS logic, and the phase-to-amplitude conversion is completed through a bipolar differential pair. The circuit has been processed in a BiCMOS SiGe:C 0.25 $mu$m technology. The power consumption is 308 mW and it operates from a 2.8 V supply. The chip core area is 1 mm$^2$.

Mots-Clés / Keywords
BiCMOS; SiGe; Direct digital synthesizer; Synthesizer;

112602
07381
08/11/2007

Assessing zener diodes structures reliability from their low frequency noise

J.GRAFFEUIL, L.BARY, J.RAYSSAC, J.G.TARTARIN, L. LOPEZ

2I, CNES, MOST

Revue Scientifique : IEEE Transactions on Device and Materials Reliability, Vol.7, N°3, pp.468-472, Novembre 2007 , N° 07381

Diffusable

Plus d'informations

Abstract

An electrical stress test has been conducted on 98 Zener conventional reference diodes structures and it has been observed that 45 % of these devices failed after 3000 hours. However this high failure ratio can be reduced to below 25 %, or less, providing that an appropriate low frequency noise (LFN) characterization is initially performed and that all the devices exhibiting the larger LFN are subtracted from the lot subjected to electrical stress test. Further results obtained after a 4500 hours electrical stress test conducted on a reduced number of diodes fully validate this finding.

Mots-Clés / Keywords
Reliability testing; Low frequency noise measurement; Zener diode;

111887
06551
10/12/2006

A 3-bits DDS oriented low power consumption 15 GHz phase accumulator in a 0.25 um BiCMOS SiGe:C technology

S.THURIES, E.TOURNIER, J.GRAFFEUIL

MOST

Manifestation avec acte : 13th IEEE International Conference on Electronics, Circuits and Systems (ICECS'2006), Nice (France), 10-13 Décembre 2006, 4p. , N° 06551

Diffusable

109013
06474
27/08/2006

Robust gan electronics for highly reliable BF and RF analog systems in aerospace applications

G.SOUBERCAZE PUN, J.G.TARTARIN, L.BARY, J.RAYSSAC, S.DELAGE, J.GRAFFEUIL

MOST, 2I, TRT, TIGER

Manifestation avec acte : CANEUS 2006, Toulouse (France), 27 Août - 1er Septembre 2006, 7p. , N° 06474

Diffusable

107581
06139
15/03/2006

Design of a X-band GaN oscillator: from the low frequency noise device characterization and large signal modeling to circuit design

G.SOUBERCAZE PUN, J.G.TARTARIN, L.BARY, J.RAYSSAC, E.MORVAN, B.GRIMBERT, S.L.DELAGE, J.C.DE JAEGER, J.GRAFFEUIL

2I, ALCATEL THALES III-V, IEMN Villeneuve, THOMSON CSF-LCR, MOST

Rapport LAAS N°06139, Mars 2006, 4p.

Diffusable

Plus d'informations

Abstract

Although GaN technologies were initially developed for solid state source amplifiers, it was recently demonstrated that AlGaN/GaN HEMT transistors were also suitable for low noise applications such as LNA. The frequency synthesis is not yet widely explored for these technologies. In this paper the design of a low phase noise X-Band oscillator is proposed. The low frequency noise performance and the residual phase noise, as well as dynamic S-parameters were carried out on AlGaN/GaN HEMT grown on SiC. A large-signal modeling technique is also presented. The reduced complexity and the good accuracy of our large signal model permits an efficient circuit design, without intensive knowledge of the technological device parameters. These characterization and modeling tools are used for the design of an 1-stage oscillator working at 10 GHz delivering 20dBm.

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