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Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests
S.BEN DHIA, A.BOYER, B.LI, A.N.CISSE
ISGE, LATTIS, Toulouse
Revue Scientifique : Electronics Letters, Vol.46, N°4, pp.278-280, Mars 2010 , N° 10963
Lien : http://hal.archives-ouvertes.fr/hal-00669745
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Abstract
Presented is an original study about the effects of integrated circuit aging on electromagnetic emission and immunity to radio frequency interferences. For the first time an electromagnetic compatibility (EMC) qualification procedure is proposed to quantify the EMC level variation over the full lifetime of a component. Results presented show non-negligible variations of the emission and immunity thresholds after accelerated life tests, which could seriously deteriorate EMC margins required to ensure compliance with standard EMC levels.