Laboratoire d’Analyse et d’Architecture des Systèmes
M.IBARRA MANZANO, M.DEVY, J.L.BOIZARD, P.LACROIX, J.Y.FOURNIOLS
RAP, N2IS, 2I
Manifestation avec acte : International Conference on Field Programmable Logic and Applications (FPL 2009), Prague (République Tchèque), 31 Août - 3 Septembre 2009, pp.444-447 , N° 09843
Diffusable
123593M.MATMAT, F.COCCETTI, A.MARTY, R.PLANA, C.ESCRIBA, J.Y.FOURNIOLS, D.ESTEVE
N2IS, 2I, MINC
Revue Scientifique : Microelectronics Reliability, Vol.49, N°9-11, pp.1304-1308, Août 2009, doi:10.1016/j.microrel.2009.06.049 , N° 09506
Diffusable
Plus d'informations
The reliability of integrated systems is considered as a major obstacle in their development. The goal of this work is to estimate the lifetime of RF MEMS capacitive switch devices. This is performed by combining the functional and physical failure analysis models using the VHDL-AMS language. The physics of charging effects along with mechanical behavior of the membrane are introduced simultaneously to determine the time to failure.
M.IBARRA MANZANO, M.DEVY, J.L.BOIZARD, P.LACROIX, W.FILALI, J.Y.FOURNIOLS
N2IS, RAP, 2I
Manifestation avec acte : Manifestations avec actes, 9th International Workshop on Electronics, Control, Modelling, Measurement and Signals (ECMS 2009), Mondragon (Espagne), 8-10 Juillet 2009, 6p. , N° 09883
Diffusable
124861N.NASREDDINE, J.L.BOIZARD, C.ESCRIBA, J.Y.FOURNIOLS
N2IS
Manifestation avec acte : 9th International Workshop on Electronics, Control, Modelling, Measurement and Signals (ECMS 2009), Mondragon (Espagne), 8-10 Juillet 2009, 6p. , N° 09376
Diffusable
118799M.DEVY, M.IBARRA MANZANO, J.L.BOIZARD, P.LACROIX, W.FILALI, J.Y.FOURNIOLS
RAP, N2IS, 2I
Manifestation avec acte : 14th International Conference on Advanced Robotics (ICAR 2009), Munich (Allemagne), 22-26 Juin 2009, 6p. , N° 09255
Diffusable
117856N.NASREDDINE, J.L.BOIZARD, J.Y.FOURNIOLS, J.HENAUT, D.DRAGOMIRESCU, A.COUSTOU
N2IS, MINC, 2I
Manifestation avec acte : 6th International Multi Conference on Systems, Signals and Devices (SSD'09) International Conference on Sensors, Circuits and Instrumentation Systems (SCI), Djerba (Tunisie), 23-26 Mars 2009, pp.214-216 , N° 09086
Diffusable
Plus d'informations
Embedded complex systems manufacturing becomes more and more a multidisciplinary problem. So complex systems, such as telecommunication systems, control systems, etc., must have a special simulation and validation process that mixes both analog and digital circuitry, collects all results from partials and specials simulations to be injected in behavioral models of all system components. Simulation results help us to take decisions; the strength of these decisions is a direct function of the validity of these results. Thus the need for efficient and valid simulation models is greater than ever. In this paper we describe some general behavioral models of element of wireless sensors network system, which let us to simulate the entire system in different use cases and all possible architectures using different protocols and technologies in an optimum time.
M.LASTAPIS, C.ESCRIBA, J.Y.FOURNIOLS
N2IS
Rapport de Contrat : Projet MSEPP, Mars 2009, 26p. , N° 09101
Non diffusable
116838M.LASTAPIS, C.ESCRIBA, J.Y.FOURNIOLS
N2IS
Rapport de Contrat : Projet MSEPP, Mars 2009, 14p. , N° 09099
Non diffusable
116834M.LASTAPIS, C.ESCRIBA, J.Y.FOURNIOLS
N2IS
Rapport de Contrat : Projet MSEPP, Mars 2009, 8p. , N° 09100
Non diffusable
116836C.ESCRIBA, J.Y.FOURNIOLS
N2IS
Rapport de Contrat : Projet Knowstress, Mars 2009, 42p. , N° 09098
Non diffusable
116810